[dpdk-dev,v3] app/test: reduced duration of red_autotest

Message ID 1465813598-126199-1-git-send-email-tomasz.kantecki@intel.com (mailing list archive)
State Accepted, archived
Headers

Commit Message

Kantecki, Tomasz June 13, 2016, 10:26 a.m. UTC
  'red_autotest' changed to run only functional tests without test #4 which was
taking ~53 seconds. 'red_autotest' takes ~2[s] now.
'red_perf' has been added to run performance tests only).
'red_all' has been added to run all functional tests (including #4) and
perfromance tests. This reflects current 'red_autotest' behavior.

Other changes:
- machine TSC clock frequency detection takes place only once now.
- timeouts and number of iterations in functional tests have been reduced
  in order to shorten test duration.

Signed-off-by: Tomasz Kantecki <tomasz.kantecki@intel.com>
---
 app/test/test_red.c | 89 ++++++++++++++++++++++++++++++++++++++++++++---------
 1 file changed, 74 insertions(+), 15 deletions(-)
  

Comments

Thomas Monjalon June 13, 2016, 7:52 p.m. UTC | #1
2016-06-13 11:26, Tomasz Kantecki:
> 'red_autotest' changed to run only functional tests without test #4 which was
> taking ~53 seconds. 'red_autotest' takes ~2[s] now.
> 'red_perf' has been added to run performance tests only).
> 'red_all' has been added to run all functional tests (including #4) and
> perfromance tests. This reflects current 'red_autotest' behavior.
> 
> Other changes:
> - machine TSC clock frequency detection takes place only once now.
> - timeouts and number of iterations in functional tests have been reduced
>   in order to shorten test duration.
> 
> Signed-off-by: Tomasz Kantecki <tomasz.kantecki@intel.com>

Applied, thanks
  

Patch

diff --git a/app/test/test_red.c b/app/test/test_red.c
index 81c9d67..2384c55 100644
--- a/app/test/test_red.c
+++ b/app/test/test_red.c
@@ -57,6 +57,7 @@ 
 #define MSEC_PER_SEC           1000      /**< Milli-seconds per second */
 #define USEC_PER_MSEC          1000      /**< Micro-seconds per milli-second */
 #define USEC_PER_SEC           1000000   /**< Micro-seconds per second */
+#define NSEC_PER_SEC           (USEC_PER_SEC * 1000) /**< Nano-seconds per second */
 
 /**< structures for testing rte_red performance and function */
 struct test_rte_red_config {        /**< Test structure for RTE_RED config */
@@ -280,12 +281,15 @@  static uint64_t get_machclk_freq(void)
 	uint64_t start = 0;
 	uint64_t end = 0;
 	uint64_t diff = 0;
-	uint64_t clk_freq_hz = 0;
+	static uint64_t clk_freq_hz;
 	struct timespec tv_start = {0, 0}, tv_end = {0, 0};
 	struct timespec req = {0, 0};
 
-	req.tv_sec = 1;
-	req.tv_nsec = 0;
+	if (clk_freq_hz != 0)
+		return clk_freq_hz;
+
+	req.tv_sec = 0;
+	req.tv_nsec = NSEC_PER_SEC / 4;
 
 	clock_gettime(CLOCK_REALTIME, &tv_start);
 	start = rte_rdtsc();
@@ -435,8 +439,8 @@  static struct test_queue ft_tqueue = {
 };
 
 static struct test_var ft_tvar = {
-	.wait_usec = 250000,
-	.num_iterations = 20,
+	.wait_usec = 10000,
+	.num_iterations = 5,
 	.num_ops = 10000,
 	.clk_freq = 0,
 	.dropped = ft_dropped,
@@ -1747,6 +1751,16 @@  struct tests func_tests[] = {
 	{ &ovfl_test1_config, ovfl_test1 },
 };
 
+struct tests func_tests_quick[] = {
+	{ &func_test1_config, func_test1 },
+	{ &func_test2_config, func_test2 },
+	{ &func_test3_config, func_test3 },
+	/* no test 4 as it takes a lot of time */
+	{ &func_test5_config, func_test5 },
+	{ &func_test6_config, func_test6 },
+	{ &ovfl_test1_config, ovfl_test1 },
+};
+
 struct tests perf_tests[] = {
 	{ &perf1_test1_config, perf1_test },
 	{ &perf1_test2_config, perf1_test },
@@ -1850,27 +1864,60 @@  test_invalid_parameters(void)
 	return 0;
 }
 
+static void
+show_stats(const uint32_t num_tests, const uint32_t num_pass)
+{
+	if (num_pass == num_tests)
+		printf("[total: %u, pass: %u]\n", num_tests, num_pass);
+	else
+		printf("[total: %u, pass: %u, fail: %u]\n", num_tests, num_pass,
+		       num_tests - num_pass);
+}
+
+static int
+tell_the_result(const uint32_t num_tests, const uint32_t num_pass)
+{
+	return (num_pass == num_tests) ? 0 : 1;
+}
+
 static int
 test_red(void)
 {
 	uint32_t num_tests = 0;
 	uint32_t num_pass = 0;
-	int ret = 0;
 
 	if (test_invalid_parameters() < 0)
 		return -1;
+	run_tests(func_tests_quick, RTE_DIM(func_tests_quick),
+		  &num_tests, &num_pass);
+	show_stats(num_tests, num_pass);
+	return tell_the_result(num_tests, num_pass);
+}
+
+static int
+test_red_perf(void)
+{
+	uint32_t num_tests = 0;
+	uint32_t num_pass = 0;
 
-	run_tests(func_tests, RTE_DIM(func_tests), &num_tests, &num_pass);
 	run_tests(perf_tests, RTE_DIM(perf_tests), &num_tests, &num_pass);
+	show_stats(num_tests, num_pass);
+	return tell_the_result(num_tests, num_pass);
+}
 
-	if (num_pass == num_tests) {
-		printf("[total: %u, pass: %u]\n", num_tests, num_pass);
-		ret = 0;
-	} else {
-		printf("[total: %u, pass: %u, fail: %u]\n", num_tests, num_pass, num_tests - num_pass);
-		ret = -1;
-	}
-	return ret;
+static int
+test_red_all(void)
+{
+	uint32_t num_tests = 0;
+	uint32_t num_pass = 0;
+
+	if (test_invalid_parameters() < 0)
+		return -1;
+
+	run_tests(func_tests, RTE_DIM(func_tests), &num_tests, &num_pass);
+	run_tests(perf_tests, RTE_DIM(perf_tests), &num_tests, &num_pass);
+	show_stats(num_tests, num_pass);
+	return tell_the_result(num_tests, num_pass);
 }
 
 static struct test_command red_cmd = {
@@ -1878,3 +1925,15 @@  static struct test_command red_cmd = {
 	.callback = test_red,
 };
 REGISTER_TEST_COMMAND(red_cmd);
+
+static struct test_command red_cmd_perf = {
+	.command = "red_perf",
+	.callback = test_red_perf,
+};
+REGISTER_TEST_COMMAND(red_cmd_perf);
+
+static struct test_command red_cmd_all = {
+	.command = "red_all",
+	.callback = test_red_all,
+};
+REGISTER_TEST_COMMAND(red_cmd_all);